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Formation of CuIn(S, Se)2 thin film by thermal diffusion of sulfur and selenium vapours into Cu-In alloy within a closed graphite container

Identifieur interne : 015184 ( Main/Repository ); précédent : 015183; suivant : 015185

Formation of CuIn(S, Se)2 thin film by thermal diffusion of sulfur and selenium vapours into Cu-In alloy within a closed graphite container

Auteurs : RBID : Pascal:99-0365857

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English descriptors

Abstract

The formation of CuIn(S,Se)2 thin films by thermal diffusion of sulfur (S) and selenium (Se) vapours into co-sputtered Cu-In alloy within a closed-space graphite container is reported. All films were characterized by X-ray diffraction (XRD). scanning electron microscopy (SEM), energy dispersive X-ray analysis (EDX), Four-point-probe and hot-probe measurements. Cu-In alloy films with composition varying from Cu-rich to In-rich were deposited. The synthesized In-rich films yielded CuIn5(S,Se)8 spinel compound which gradually transformed into a single phase CuIn(S,Se)2 as the film composition approached the Cu-rich region. The morphology of the CuIn5(S,Se)8 was found to differ from the stoichiometric and Cu-rich CuIn(S,Se)2 as observed from SEM. EDX composition analysis of the films showed a Cu/In ratio varying from 0.36 to 1.54 and a (S + Se)/(Cu + In) varying from 0.97 to 1.32. The amount of S incorporated in the films was found to differ with changes in the composition. The resistivity of the films ranged between 10-1 and 107 Ω cm and it strongly followed the change in the alloy film composition.

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Pascal:99-0365857

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<title xml:lang="en" level="a">Formation of CuIn(S, Se)
<sub>2</sub>
thin film by thermal diffusion of sulfur and selenium vapours into Cu-In alloy within a closed graphite container</title>
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<name sortKey="Adurodija, F O" uniqKey="Adurodija F">F. O. Adurodija</name>
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<s1>New Energy Department, Korea Institute of Energy Research, 71-2, Jang-dong</s1>
<s2>Yusong, Taejon 305-343</s2>
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<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>4 aut.</sZ>
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<country>Corée du Sud</country>
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<name sortKey="Song, J" uniqKey="Song J">J. Song</name>
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<div type="abstract" xml:lang="en">The formation of CuIn(S,Se)
<sub>2</sub>
thin films by thermal diffusion of sulfur (S) and selenium (Se) vapours into co-sputtered Cu-In alloy within a closed-space graphite container is reported. All films were characterized by X-ray diffraction (XRD). scanning electron microscopy (SEM), energy dispersive X-ray analysis (EDX), Four-point-probe and hot-probe measurements. Cu-In alloy films with composition varying from Cu-rich to In-rich were deposited. The synthesized In-rich films yielded CuIn
<sub>5</sub>
(S,Se)
<sub>8</sub>
spinel compound which gradually transformed into a single phase CuIn(S,Se)
<sub>2</sub>
as the film composition approached the Cu-rich region. The morphology of the CuIn
<sub>5</sub>
(S,Se)
<sub>8</sub>
was found to differ from the stoichiometric and Cu-rich CuIn(S,Se)
<sub>2</sub>
as observed from SEM. EDX composition analysis of the films showed a Cu/In ratio varying from 0.36 to 1.54 and a (S + Se)/(Cu + In) varying from 0.97 to 1.32. The amount of S incorporated in the films was found to differ with changes in the composition. The resistivity of the films ranged between 10
<sup>-1</sup>
and 10
<sup>7</sup>
Ω cm and it strongly followed the change in the alloy film composition.</div>
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<sub>2</sub>
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<s0>The formation of CuIn(S,Se)
<sub>2</sub>
thin films by thermal diffusion of sulfur (S) and selenium (Se) vapours into co-sputtered Cu-In alloy within a closed-space graphite container is reported. All films were characterized by X-ray diffraction (XRD). scanning electron microscopy (SEM), energy dispersive X-ray analysis (EDX), Four-point-probe and hot-probe measurements. Cu-In alloy films with composition varying from Cu-rich to In-rich were deposited. The synthesized In-rich films yielded CuIn
<sub>5</sub>
(S,Se)
<sub>8</sub>
spinel compound which gradually transformed into a single phase CuIn(S,Se)
<sub>2</sub>
as the film composition approached the Cu-rich region. The morphology of the CuIn
<sub>5</sub>
(S,Se)
<sub>8</sub>
was found to differ from the stoichiometric and Cu-rich CuIn(S,Se)
<sub>2</sub>
as observed from SEM. EDX composition analysis of the films showed a Cu/In ratio varying from 0.36 to 1.54 and a (S + Se)/(Cu + In) varying from 0.97 to 1.32. The amount of S incorporated in the films was found to differ with changes in the composition. The resistivity of the films ranged between 10
<sup>-1</sup>
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<s5>15</s5>
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